By Topic

High resolution magnetic imaging of perpendicular magnetic recording head using frequency-modulated magnetic force microscopy with a hard magnetic tip

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

6 Author(s)
Lu, Wei ; School of Materials Science and Engineering, Shanghai Key Laboratory of D&A for Metal-Functional Materials, Tongii University, Shanghai 200092, People''s Republic of China ; Zhenghua Li ; Hatakeyama, Kodai ; Egawa, Genta
more authors

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.3378977 

High resolution imaging of ac magnetic field from a trailing-edge shielded perpendicular magnetic writing head was demonstrated by using frequency-modulated magnetic force microscopy (FM-MFM) with a high-coercivity FePt MFM tip. The distribution of perpendicular magnetic field gradient of the recording head is presented and can be used to evaluate the recording performance of the head. A Fourier analysis of the images suggests that magnetic spectral features as small as 15 nm should be detectable by using the FM-MFM technique with a high coercivity tip. The enhancement in spatial resolution of FM-MFM is very crucial for the analysis of nanoscale magnetic features and to shed light on the development of next generation magnetic recording heads.

Published in:

Applied Physics Letters  (Volume:96 ,  Issue: 14 )