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High resolution magnetic imaging of perpendicular magnetic recording head using frequency-modulated magnetic force microscopy with a hard magnetic tip

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6 Author(s)
Lu, Wei ; School of Materials Science and Engineering, Shanghai Key Laboratory of D&A for Metal-Functional Materials, Tongii University, Shanghai 200092, People''s Republic of China ; Zhenghua Li ; Hatakeyama, Kodai ; Egawa, Genta
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High resolution imaging of ac magnetic field from a trailing-edge shielded perpendicular magnetic writing head was demonstrated by using frequency-modulated magnetic force microscopy (FM-MFM) with a high-coercivity FePt MFM tip. The distribution of perpendicular magnetic field gradient of the recording head is presented and can be used to evaluate the recording performance of the head. A Fourier analysis of the images suggests that magnetic spectral features as small as 15 nm should be detectable by using the FM-MFM technique with a high coercivity tip. The enhancement in spatial resolution of FM-MFM is very crucial for the analysis of nanoscale magnetic features and to shed light on the development of next generation magnetic recording heads.

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Applied Physics Letters  (Volume:96 ,  Issue: 14 )