Cart (Loading....) | Create Account
Close category search window

Optically Modulated Probe for Precision Near-Field Measurements

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Memarzadeh-Tehran, H. ; Ecole Polytech. de Montreal, Montreal, QC, Canada ; Laurin, J. ; Kashyap, R.

In this paper, the design and implementation of an accurate, sensitive, and cost-effective near-field (NF) probe are discussed. The probe is based on the modulated scatterer technique (MST), providing very low perturbation on the field to be measured. It consists of a commercial off-the-shelf (COTS) photodiode chip and an antenna acting as a scatterer. The optically modulated scatterer (OMS) essentially makes the NF measurements perturbation free. A matching network is added to the probe structure to increase its sensitivity. The radiation characteristics of the probe, including cross-polarization response and omnidirectional sensitivity, are both theoretically and experimentally investigated. Finally, the performance and reliability of the probe are studied by comparing the measured NF distributions to the simulated distributions.

Published in:

Instrumentation and Measurement, IEEE Transactions on  (Volume:59 ,  Issue: 10 )

Date of Publication:

Oct. 2010

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.