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Testing ICs: getting to the core of the problem

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2 Author(s)
Murray, B.T. ; Gen. Motors R&D Center, USA ; Hayes, J.P.

The article examines the market and technology trends affecting the testing of integrated circuits, with emphasis on the role of predesigned components-cores-and built in self test. We explain manufacturing testing, as opposed to design testing, which happens before manufacturing, and online testing, which happens after

Published in:

Computer  (Volume:29 ,  Issue: 11 )