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A new thin-reflector mode for ultrasonic particle manipulation in layered resonators

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4 Author(s)
Glynne-Jones, P. ; Sch. of Eng. Sci., Univ. of Southampton, Southampton, UK ; Boltryk, R.J. ; Hill, M. ; Harris, N.R.

Previous literature has described two major classes of sub-wavelength planar acoustic particle manipulation devices: (a) those where the dominant resonance is in the fluid layer, leading to agglomeration at one or more pressure nodes within the fluid layer; and (b) those where a resonant reflector layer provides a pressure release boundary condition, causing the agglomeration position to occur at a pressure node close to the fluid/ reflector interface (Quarter-wave devices). We describe here a new arrangement which operates at the first thickness resonance of a layered structure. This leads to pressure nodes at the air boundaries of a device. By designing with only a thin reflector layer (significantly less than ¿/4) particles at all positions within the channel are forced to the reflector/fluid layer boundary. We model and experimentally characterize a device, and show that it can produces forces of order 55pN on a 10¿m diameter polystyrene bead with transducer excitation of 25Vpp. We also explore the parameter space to find optimum designs, and present a particle concentration device using this mode. We demonstrate that this configuration will work efficiently with lossy polymer reflector layers, making possible cheap, disposable devices.

Published in:

Ultrasonics Symposium (IUS), 2009 IEEE International

Date of Conference:

20-23 Sept. 2009