Cart (Loading....) | Create Account
Close category search window
 

Scanned-beam assisted mild tumor heating using a dual-functional ultrasound linear array

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

6 Author(s)
Chun-Yen Lai ; Dept. of Biomed. Eng., Univ. of California at Davis, Davis, CA, USA ; Kruse, D.E. ; Caskey, C.F. ; Stephens, D.N.
more authors

A commercial ultrasound scanner, a customized co-linear array ultrasound transducer and a real-time temperature feedback controller have been combined to generate controlled mild hyperthermia. Previous studies have shown that single beam-based image-guided local drug delivery can improve the treatment of small tumors. In this study, a scanned-beam based insonation mode was developed to achieve uniform therapy over a larger region. A color-region of interest (ROI) was used to define the scanned area, while periodic B-mode imaging was used to visualize the tumor. In this study, a thermal strain algorithm was also examined for temperature estimation and this algorithm will be applied for temperature control in the future.

Published in:

Ultrasonics Symposium (IUS), 2009 IEEE International

Date of Conference:

20-23 Sept. 2009

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.