By Topic

All-Optical Wavelength Conversion of 10 Gb/s RZ-OOK Data in a Silicon Nanowire via Cross-Phase Modulation: Experiment and Theoretical Investigation

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

8 Author(s)
Driscoll, J.B. ; Microelectron. Sci. Labs., Columbia Univ., New York, NY, USA ; Astar, W. ; Xiaoping Liu ; Dadap, J.I.
more authors

Wavelength conversion of a 10 Gb/s 2.7%-duty-cycle return-to-zero (RZ) OOK (RZ-OOK) signal using XPM in a compact silicon nanowire waveguide (Si nanowire) and a detuned filter is successfully demonstrated for the first time. A 10-9-BER receiver sensitivity penalty of <;1 dB was measured for the converted signal relative to the baseline signal, with a filter-probe detuning of 0.6 nm. The system is numerically modeled and the results are shown to match well with the experimental results. The numerical model is further used to design an optimal filter that would eliminate filter-probe detuning.

Published in:

Selected Topics in Quantum Electronics, IEEE Journal of  (Volume:16 ,  Issue: 5 )