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Measurement-Based Ring Oscillator Variation Analysis

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6 Author(s)
Johguchi, K. ; Hiroshima Univ., Hiroshima, Japan ; Kaya, A. ; Mattausch, H.J. ; Koide, T.
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As transistor size scales down, unavoidable process variations are rapidly increasing. Consequently, it's essential for designers to accurately estimate within-die and interdie variations so that circuits and integrated systems can operate correctly. This article describes an analysis of ring oscillators that were designed in 180-nm and 100-nm CMOS technologies, and discusses the oscillators' frequency variations as determined for different stage numbers and supply voltages.

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Design & Test of Computers, IEEE  (Volume:27 ,  Issue: 5 )