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Functional broadside tests were defined as broadside tests where the scan-in state is a reachable state. This ensures that during the functional capture cycles of the test, the circuit visits states that it can also visit during functional operation. As a result, it avoids overtesting that may occur with unreachable states. However, the scan-out operation at the end of a functional broadside test allows the observation of any fault effects that reached the state variables at the end of the second capture cycle. As a result, a functional broadside test may detect faults that cannot affect functional operation (redundant faults). Addressing this issue completely requires full sequential test generation. We discuss an alternate solution that fits naturally with an existing process for generating functional broadside tests.