By Topic

A Multiport Measurement System for Complex Distortion Measurements of Nonlinear Microwave Systems

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Walid S. El-Deeb ; Department of Electrical and Computer Engineering, University of Calgary, Calgary, Canada ; Noureddine Boulejfen ; Fadhel M. Ghannouchi

An effective multiport measurement system for the characterization of N-port nonlinear microwave devices is proposed. The proposed measurement system has the capability of measuring the S-parameters of linear microwave circuits and the amplitude-modulation-to-amplitude-modulation (AM/AM) and amplitude-modulation-to-phase-modulation (AM/PM) conversions for fundamental and harmonic frequencies for nonlinear microwave devices on single-step measurement without any need for reconnection or change in the calibration technique or measurement setup. It is found suitable that the proposed system can accurately quantify the impact of crosstalk on the performance of multibranch amplifiers and multiport nonlinear microwave systems in terms of power efficiency and signal distortion.

Published in:

IEEE Transactions on Instrumentation and Measurement  (Volume:59 ,  Issue: 5 )