By Topic

AC Loss Analysis of HTS Power Cable With RABiTS Coated Conductor

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Seokho Kim ; Korea Electrotechnol. Res. Inst., Changwon, South Korea ; Kideok Sim ; Jeonwook Cho ; Jang, H.-M.
more authors

Numerical analysis of AC loss for a HTS power cable is investigated using commercial FEM software package. AC loss of the HTS power cable, which is made by 2 G conductor, is hard to experimentally measure due to very small signal compared to that made by 1G conductor. The FEM model describes current distribution and AC loss inside the HTS conductor for the AC transport current through nonlinear E-J correlation. For the verification of the AC loss analysis model, the results were compared with the well known analytic solution of a single strip HTS conductor and experiments. Unlike IBAD substrate, magnetization of the RABiTS has influence on the precise estimation of the AC loss and it is also considered in the FEM model. Moreover, several conductors should be stacked to meet the large transport current because of the small critical current at present and the effect of stacking configuration is also investigated. In this paper, AC loss analysis results are presented for various HTS power cable configurations such as stacking directions. The results are compared with the experimental results of a model HTS power cable and the best configuration to minimize AC loss is suggested.

Published in:

Applied Superconductivity, IEEE Transactions on  (Volume:20 ,  Issue: 3 )