By Topic

A full wave analysis of microstrips by the boundary element method

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Shih-Yuan Lin ; Dept. of Electr. & Comput. Eng., California Univ., Irvine, CA, USA ; C. C. Lee

In this paper, the boundary element method (BEM) is formulated to carry out a full wave analysis of microstrip lines. Numerical results for frequency dependence of effective dielectric constant and calculated longitudinal and transverse current distributions are presented. Fundamental and higher order modes supported by the microstrip are identified and characterized. Compared with other techniques, the present method requires less memory size without requiring intricate mathematical skills because of the inherent characterization of BEM in needing only to discretize the boundary of the structure. Through our simulation, it shows that this method can reduce memory size as well as the computation time. Numerical results also show good agreement with available data in literature

Published in:

IEEE Transactions on Microwave Theory and Techniques  (Volume:44 ,  Issue: 11 )