By Topic

A complexity analysis of sequential ATPG

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Marchok, T.E. ; Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA ; El-Maleh, A. ; Maly, W. ; Rajski, J.

The research reported in this paper has been conducted to identify those attributes, of both sequential circuits and structural, sequential automatic test pattern generation algorithms, which can lead to extremely long test generation times. The retiming transformation is used to create families of circuits which have the same sequential depth and number and length of cycles, but a significantly different percentage of valid states. It was observed for three different sequential test pattern generators that the increase in complexity of test pattern generation is related to a new circuit attribute, termed density of encoding, and not to the sequential depth or number and length of cycles-i.e., those circuit parameters to which the complexity of test pattern generation has traditionally been attributed

Published in:

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on  (Volume:15 ,  Issue: 11 )