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Limitations of Digital CMOS-Processes for Analog Applications due to Channel Length Modulation and Hot Carrier Degradation

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2 Author(s)
Steimle, M. ; Siemens AG, Semiconductor Division, Munich, Germany ; Muhlhoff, H.-M.

First Page of the Article

Published in:
Solid State Device Research Conference, 1991. ESSDERC '91. 21st European

Date of Conference: 16-19 Sept. 1991

Page(s):
429 - 432
Print ISBN:
0444890661
Conference Location :
Montreux, Switzerland
Product Type:
Conference Publications

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