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Test data compression using extended frequency-directed run length code based on compatibility

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5 Author(s)
Wan, M.Y. ; Inst. of VLSI Design, Zhejiang Univ., Hangzhou, China ; Ding, Y. ; Pan, Y. ; Zhou, S.
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A new test data compression method is presented. Based on the fact that adjacent test vectors in a test set have least incompatible bits, test vectors are grouped and amalgamated into a vector by assigning 1 or 0 to unspecified bits and c to incompatible bits. Extended frequency-directed run length based on compatibility (EFDR-BC) is used to encode the merged test vector. EFDR-BC can encode strings of 1s, 0s, and cs. The numbers of test vectors, incompatible bits and values of incompatible bits in a group make up the group head code. Experiments with the test sets of the ISCAS 89 benchmark circuit show that the method can achieve higher compression ratio.

Published in:

Electronics Letters  (Volume:46 ,  Issue: 6 )

Date of Publication:

March 18 2010

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