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Accurate characterization of random process variations using a robust low-voltage high-sensitivity sensor featuring replica-bias circuit

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4 Author(s)
Meterelliyoz, M. ; Intel, Hillsboro, OR, USA ; Goel, A. ; Kulkarni, J.P. ; Roy, K.

We design a low-voltage high-sensitivity random-process-variations sensor using an on-chip calibration circuit for improved accuracy. The sensor features a replica-biasing circuit that compensates global PVT variations and maintains sensitivity for robust operation. Measurement results from 90 nm test hip demonstrate the effectiveness of the sensor.

Published in:

Solid-State Circuits Conference Digest of Technical Papers (ISSCC), 2010 IEEE International

Date of Conference:

7-11 Feb. 2010