Referenced Items are not available for this document.
A pseudo-multiple sampling technique for a low-noise CIS is implemented using a conventional column-parallel single-slope ADC structure with no additional circuitry. It is applied to a 1/3.2-inch 8Mpixel CIS. Measurement results show the technique effectively reduces dark temporal noise from 1.6e- to 1.2e- in 10 b ADC mode, and from 1.8e- to 1.1e- in 12b ADC mode.
Published in:
Solid-State Circuits Conference Digest of Technical Papers (ISSCC), 2010 IEEE International
Date of Conference: 7-11 Feb. 2010
- Page(s):
- 396 - 397
- ISSN :
- 0193-6530
- Print ISBN:
- 978-1-4244-6033-5
- INSPEC Accession Number:
- 11204873
- Conference Location :
- San Francisco, CA
- Digital Object Identifier :
- 10.1109/ISSCC.2010.5433971
- Product Type:
- Conference Publications
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