By Topic

Multiple Scan Trees Synthesis for Test Time/Data and Routing Length Reduction Under Output Constraint

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Shu-Min Li, K. ; Dept. of Comput. Sci. & Eng., Nat. Sun Yat-Sen Univ., Kaohsiung, Taiwan

A synthesis methodology for multiple scan trees that considers output pin limitation, scan chain routing length, test application time, and test data compression rate simultaneously is proposed in this paper. Multiple scan trees, also known as a scan forest, greatly reduce test data volume and test application time in system-on-chip testing. However, previous research on scan tree synthesis rarely considered issues such as, routing length and output port limitation, and hence created scan trees with a large number of scan output ports and excessively long routing paths. The proposed algorithm provides a mechanism that effectively reduces test time and test data volume, and routing length under output port constraint. As a result, very few or no output compressors are required, which significantly reduces the hardware overhead.

Published in:

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on  (Volume:29 ,  Issue: 4 )