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Power Supply Noise: A Survey on Effects and Research

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2 Author(s)
Tehranipoor, M. ; Univ. of Connecticut, Storrs, CT, USA ; Butler, K.M.

As technology scales to 32 nm and functional frequency and density continue to rise, PSN effects, which can reduce a circuit's noise immunity and could lead to failures, pose new challenges to chip manufacturers and foundries. This article provides an overview of low-power and delay testing, and surveys ongoing research for analyzing and dealing with PSN effects during delay test and timing analysis.

Published in:

Design & Test of Computers, IEEE  (Volume:27 ,  Issue: 2 )