By Topic

Semi-automated Test Planning for e-ID Systems by Using Requirements Clustering

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Guldali, B. ; Software Quality Lab., Univ. of Paderborn, Paderborn, Germany ; Sauer, S. ; Engels, G. ; Funke, H.
more authors

In acceptance testing, customer requirements as specified in system specifications have to be tested for their successful implementation. This is a time-consuming task due to inherent system complexity and thus a large number of requirements. In order to reduce efforts in acceptance testing, we introduce a novel approach that exploits redundancies and implicit relations in requirements specifications, which are based on multi-viewpoint techniques, in our case the reference model for open distributed processing (RM-ODP). It deploys requirements clustering and linguistic analysis techniques for reducing the total number of test cases. We report on concrete experiences with this approach within joint R&D work of the Software Quality Lab (s-lab) of the University of Paderborn and HJP Consulting, an international consulting company, specialized in planning, procurement and acceptance testing of national electronic identification (e-ID) systems. The paper is concluded with an overview on the current tool support especially for automated detection of the redundancies and implicit relations in requirements. Also the future work on the tool support for the overall test specification process is discussed.

Published in:

Automated Software Engineering, 2009. ASE '09. 24th IEEE/ACM International Conference on

Date of Conference:

16-20 Nov. 2009