Cart (Loading....) | Create Account
Close category search window
 

Skew Estimation of Document Images Using Bagging

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Gaofeng Meng ; Nat. Lab. of Pattern Recognition, Chinese Acad. of Sci., Beijing, China ; Chunhong Pan ; Nanning Zheng ; Chen Sun

This paper proposes a general-purpose method for estimating the skew angles of document images. Rather than to derive a skew angle merely from text lines, the proposed method exploits various types of visual cues of image skew available in local image regions. The visual cues are extracted by Radon transform and then outliers of them are iteratively rejected through a floating cascade. A bagging (bootstrap aggregating) estimator is finally employed to combine the estimations on the local image blocks. Our experimental results show significant improvements against the state-of-the-art methods, in terms of execution speed and estimation accuracy, as well as the robustness to short and sparse text lines, multiple different skews and the presence of nontextual objects of various types and quantities.

Published in:

Image Processing, IEEE Transactions on  (Volume:19 ,  Issue: 7 )

Date of Publication:

July 2010

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.