By Topic

Pseudorandom Bit Generation Using Coupled Congruential Generators

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Katti, R.S. ; Dept. of Electr. & Comput. Eng., North Dakota State Univ., Fargo, ND, USA ; Kavasseri, R.G. ; Sai, V.

In this brief, we propose the generation of a pseudorandom bit sequence (PRBS) using a comparative linear congruential generator (CLCG) as follows. A bit ??1?? is output if the first linear congruential generator (LCG) produces an output that is greater than the output of the second LCG, and a bit ??0?? is output otherwise. Breaking this scheme would require one to obtain the seeds of the two independent generators given the bits of the output bit sequence. We prove that the problem of uniquely determining the seeds for the CLCG requires the following: 1) knowledge of at least log2 m 2 ( m being the LCG modulus) bits of the output sequence and 2) the solution of at least log2 m 2 inequalities, where each inequality (dictated by the output bit observed) is applied over positive integers. Computationally, we show that this task is exponential in n (where n = log2 m is the number of bits in m) with complexity O(22 n). The quality of the PRBS so obtained is assessed by performing a suite of statistical tests (National Institute of Standards and Technology (NIST) 800-22) recommended by NIST. We observe that a variant of our generator that uses two CLCGs (called dual CLCG) pass all the NIST pseudorandomness tests with a high degree of consistency.

Published in:

Circuits and Systems II: Express Briefs, IEEE Transactions on  (Volume:57 ,  Issue: 3 )