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Coercive voltages (V C, the voltage which makes remanent polarization zero in ferroelectrics) of metal-ferroelectric polymer-metal capacitors were measured with different pulse periods. From the measured V C, coercive fields (E C, normalized V C for thickness) and internal bias fields (E BIAS) were calculated. Although E C was found to be nearly constant with thickness, E BIAS increased as thickness decreased. Based on these findings, it appears that E BIAS can be induced from interface phenomenon and greatly affects retention performance in thin ferroelectric films used for nonvolatile memory devices.