By Topic

New insight into internal model control filter design for load disturbance rejection

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $33
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
T. Liu ; Hong Kong University of Science & Technology, Clear Water Bay ; F. Gao

In this study, a modified design of the internal model control (IMC) filter is proposed for improving closed-loop system performance of load disturbance rejection, especially for slow processes in industrial and chemical engineering practices. The deficiency of a conventional IMC filter design for controller tuning is revealed with regard to load disturbance rejection. By constructing one or more asymptotic canceling constraints for disturbance rejection, a modified IMC filter is proposed to reduce the influence from the time constant(s) of the process or repetitive-type load disturbance to the closed-loop disturbance rejection performance. Similar to a conventional IMC filter, there is essentially a single adjustable parameter in the proposed IMC filter, which can be monotonically tuned to meet with the compromise between the achievable disturbance rejection performance and the closed-loop system stability. Quantitative tuning formulae and guidelines for this adjustable parameter are developed in terms of the widely used first- and second-order process models with time delay. Illustrative examples are given to show the effectiveness and merits of the proposed IMC filter.

Published in:

IET Control Theory & Applications  (Volume:4 ,  Issue: 3 )