Close category search window
 

Robust Maximum Likelihood Acoustic Source Localization in Wireless Sensor Networks

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Yong Liu ; Sch. of Autom., Northwestern Polytech. Univ., Xi''an, China ; Yu Hen Hu ; Quan Pan

Sensor measurements in a wireless sensor network (WSN) may significantly deviate from a commonly used Gaussian noise model due to harsh operating conditions, unreliable wireless communication links, or sensor failures. In this work, a mixed Gaussian and impulse noise model is proposed to more accurately model these types of non-Gaussian noise. However, existing maximum likelihood (ML) acoustic energy based source localization algorithms are very sensitive to non-Gaussian noise perturbations. To mitigate this shortcoming, a novel M-estimate based robust estimation formulation is derived. Extensive simulation results demonstrated superior and consistent performance advantage of this robust estimation approach compared to conventional ML estimates over a wide range of practical scenarios.

Published in:
Global Telecommunications Conference, 2009. GLOBECOM 2009. IEEE

Date of Conference: Nov. 30 2009-Dec. 4 2009

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.