Cart (Loading....) | Create Account
Close category search window
 

Detection in correlated impulsive noise using fourth-order cumulants

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Sadler, B.M. ; US Army Res. Lab., Adelphi, MD, USA

We consider detection and estimation in correlated impulsive noise. The non-Gaussian impulsive noise is modeled as the sum of two linear processes: a nominal part and an impulsive part. This model admits correlated impulsive bursts lasting many data samples. Identifiability of the noise model is established using fourth- and second-order cumulants. Under this model, the correlated time series can be whitened and an appropriate memoryless nonlinearity applied to attenuate the impulsive events. A detection statistic is then formed from the output of the nonlinearity. In the threshold detection case, the use of cumulants allows identification of the noise in the presence of the signal to be detected, obviating the need for noise-only training records. Simulation results with a sample size of 512 show small loss in detector performance versus an ideal detector with no impulsive part present

Published in:

Signal Processing, IEEE Transactions on  (Volume:44 ,  Issue: 11 )

Date of Publication:

Nov 1996

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.