Cart (Loading....) | Create Account
Close category search window

Electromagnetic Analyses of Near Field UHF RFID Systems

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Fuschini, F. ; DEIS, Univ. of Bologna, Bologna, Italy ; Piersanti, C. ; Sydanheimo, L. ; Ukkonen, L.
more authors

Environmental effects may seriously threaten the performance of UHF RFID systems and reduce the rate of successful reading; many applications aiming at the so-called item-level tagging (ILT) can be therefore compromised. In order to preserve the reliability of the tag acquisition the so-called near field (NF) UHF RFID has been recently considered. In this paper, the main properties and the performance of NF UHF RFID systems are investigated by means of electromagnetic analyses based on both theoretical evaluations on simple but representative radiating elements and measurements carried out also on real UHF RFID devices.

Published in:

Antennas and Propagation, IEEE Transactions on  (Volume:58 ,  Issue: 5 )
RFID Virtual Journal, IEEE

Date of Publication:

May 2010

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.