By Topic

A Combined Method for Fast Analysis of Signal Propagation, Ground Noise, and Radiated Emission of Multilayer Printed Circuit Boards

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Xiaomin Duan ; Inst. fur Theor. Elektrotechnik, Tech. Univ. Hamburg-Harburg, Hamburg, Germany ; Rimolo-Donadio, R. ; Brüns, H.-D. ; Schuster, C.

This paper presents a method for fast and comprehensive simulation of signal propagation, power/ground noise, and radiated emissions by combining the merits of the physics-based via model, the modal decomposition technique, the contour integral method (CIM), and the equivalence principle. The physics-based via model combined with the modal decomposition technique is an efficient technique for signal integrity analysis of multilayer PCBs and packages. The CIM can be used to calculate the voltage distribution between arbitrarily shaped power planes. Far-field radiation can be obtained by applying the field equivalence principle. In this paper, we integrate the four techniques to analyze all the three effects in a fast, concurrent, and holistic manner. To the best knowledge of the authors, the four techniques are integrated here for the first time. Various structures are simulated and validated with full-wave simulations up to 20 GHz. It is shown that a reduction in simulation time of more than two orders of magnitude is achieved in comparison to a standard full-wave electromagnetic solver.

Published in:

Electromagnetic Compatibility, IEEE Transactions on  (Volume:52 ,  Issue: 2 )