Cart (Loading....) | Create Account
Close category search window

Influence of the electron cross-field diffusion in negative ion sources with the transverse magnetic field and the plasma-electrode bias

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Kuppel, S. ; Graduate School of Science and Technology, Keio University, 3-14-1 Hiyoshi, Kohoku-ku, Yokohama 223-8522, Japan ; Matsushita, D. ; Hatayama, A. ; Bacal, M.

Your organization might have access to this article on the publisher's site. To check, click on this link: 

The physical mechanisms involved in the extraction of H- ions from the negative ion source are studied with a PIC 2D3V code. The effect of a weak magnetic field transverse to the extraction direction is taken into account, along with a variable bias voltage applied on the plasma electrode (PE). In addition to previous modeling works, the electron diffusion across the magnetic field is taken into account as a simple one-dimensional random-walk process. The results show that without PE bias, the value of the diffusion coefficient has a significant influence upon the value of the extracted H- current. However, the value of this coefficient does not affect qualitatively the mechanism leading to the peak of extracted H- ion current observed for an optimum value of the PE bias.

Published in:

Review of Scientific Instruments  (Volume:81 ,  Issue: 2 )

Date of Publication:

Feb 2010

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.