By Topic

A test generation tool for specifications in the form of state machines

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Q. M. Tan ; Dept. d'Inf. et de Recherche Oper., Montreal Univ., Que., Canada ; A. Petrenko ; G. von Bochmann

This paper describes a software tool, TAG (test automatic generation), that automatically generates test cases for an FSM specification. It implements the so-called transition identification approach for test derivation, and may output test cases in the form of an SDL skeleton. The description focuses on the functions of the tool and the methods implemented in the tool, especially, the heuristic solution to the minimization of state identification sequences

Published in:

Communications, 1996. ICC '96, Conference Record, Converging Technologies for Tomorrow's Applications. 1996 IEEE International Conference on  (Volume:1 )

Date of Conference:

23-27 Jun 1996