Cart (Loading....) | Create Account
Close category search window
 

Frequency domain multiplexing of force signals with application to magnetic resonance force microscopy

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Oosterkamp, T.H. ; Leiden Institute of Physics, Leiden University, Niels Bohrweg 2, 2333 CA Leiden, The Netherlands ; Poggio, M. ; Degen, C.L. ; Mamin, H.J.
more authors

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.3304788 

Frequency domain multiplexing, using an actively damped micromechanical cantilever, is used to detect multiple force signals simultaneously. The measurement principle is applied to magnetic resonance force microscopy to allow concurrent measurement of nuclear spin signals originating from distinct regions of the sample, or from multiple spin species.

Published in:

Applied Physics Letters  (Volume:96 ,  Issue: 8 )

Date of Publication:

Feb 2010

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.