Close category search window
 

Focussing bending waves via negative refraction in perforated thin plates

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Farhat, M. ; Institut Fresnel, CNRS, Aix-Marseille Université, Campus Universitaire de Saint-Jérôme, 13013 Marseille, France ; Guenneau, Sebastien ; Enoch, S. ; Movchan, Alexander B.
more authors

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.3327813 

We propose a design of a periodically perforated thin plate leading to lensing effect of bending waves via negative refraction. To achieve this goal, we first analyze the band spectrum of the bi-harmonic operator for an array of freely vibrating square voids using both numerical (finite elements) and asymptotic methods. We then find some point in the reciprocal space where the acoustic dispersion surface displays a convex isofrequency contour shrinking with frequency. We finally demonstrate that a point force generating a bending wave above a finite array of 221 perforations displays an image underneath according to the Snell–Descartes inverted laws.

Published in:
Applied Physics Letters  (Volume:96 ,  Issue: 8 )

Date of Publication: Feb 2010

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.