Cart (Loading....) | Create Account
Close category search window
 

Studies of emittance of multiply charged ions extracted from high temperature superconducting electron cyclotron resonance ion source, PKDELIS

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

7 Author(s)
Rodrigues, G. ; Inter University Accelerator Centre, Aruna Asaf Ali Marg, New Delhi 110067, India ; Lakshmy, P.S. ; Kumar, Sarvesh ; Mandal, A.
more authors

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.3298846 

For the high current injector project at Inter University Accelerator Centre, a high temperature superconducting electron cyclotron resonance (ECR) ion source, PKDELIS, would provide the high charge state ions. The emittance of the ECR ion source is an important parameter to design further beam transport system and to match the acceptances of the downstream radio frequency quadrupole and drift tube linac accelerators of the high current injector. The emittance of the analyzed beam of PKDELIS ECR source has been measured utilizing the three beam size technique. A slit and two beam profile monitors positioned at fixed distances from each other were used to measure the beam size. The digitized beam profiles have been analyzed to determine the emittance of various multiply charged ions. The variation of emittance with gas mixing, ultrahigh frequency power, and extraction energy are discussed in this presentation.

Published in:

Review of Scientific Instruments  (Volume:81 ,  Issue: 2 )

Date of Publication:

Feb 2010

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.