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Affine point pattern matching and its application to form registration

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4 Author(s)
Safari, R. ; Windsor Univ., Ont., Canada ; Narasimhamurthi, N. ; Shridhar, M. ; Ahmadi, M.

In this paper, a new affine invariant is presented. Using this invariant, we apply a robust algorithm to find the correspondence between two different affine transformed point sets. Application of this method to form registration is presented. Assuming that a blank sample of the form is available, a new algorithm is derived for registering a filled-in form to its blank counterpart for extraction of the filled in data

Published in:

Circuits and Systems, 1996. ISCAS '96., Connecting the World., 1996 IEEE International Symposium on  (Volume:2 )

Date of Conference:

12-15 May 1996

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