Cart (Loading....) | Create Account
Close category search window
 

Sequential Track Initialization with Page's Test

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Hempel, C.G. ; Naval Undersea Warfare Center Div., Undersea Sensors & Sonar Syst., Newport, RI, USA

A new track initialization method for remote sensing systems that uses the amplitudes of the measurements to provide some statistical separation between true and false contacts is presented. In the proposed method the data are partitioned into Hough transform bins, and Page's test is performed on the data in each bin. The new method embodies the best ideas of existing sequential and batch methods, exploits both the amplitude and the temporal information in the data, and minimizes the average latency for initializing target tracks for a specified false track initialization rate. Analytic performance predictions for the proposed method for the Swerling I signal model with Poisson clutter are developed and compared with the theoretical performance of a commonly used "M of N" method. The new method provides substantial improvement in the false track initialization rate and the average latency for initializing target tracks.

Published in:

Aerospace and Electronic Systems, IEEE Transactions on  (Volume:46 ,  Issue: 1 )

Date of Publication:

Jan. 2010

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.