Cart (Loading....) | Create Account
Close category search window
 

Cross-wavelet transform as a new paradigm for feature extraction from noisy partial discharge pulses

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Dey, D. ; Dept. of Electr. Eng., Jadavpur Univ., Kolkata, India ; Chatterjee, B. ; Chakravorti, S. ; Munshi, S.

In this work a new approach based on cross-wavelet transform towards identification of noisy Partial Discharge (PD) patterns has been proposed. Different partial discharge patterns are recorded from the various samples prepared with known defects. A novel cross-wavelet transform based technique is used for feature extraction from raw noisy partial discharge signals. Noise is a significant problem in PD detection. The proposed method eliminates the requirement of denoising prior to processing and therefore it can be used to develop an automated and intelligent PD detector that requires minimal human expertise during its operation and analysis. A rough-set theory (RST) based classifier is used to classify the extracted features. Results show that the partial discharge patterns can be classified properly from the noisy waveforms. The effectiveness of the feature extraction methodology has also been verified with two other commonly used classification techniques: Artificial Neural Network (ANN) based classifier and Fuzzy classifier. It is found that the type of defect within insulation can be classified efficiently with the features extracted from cross-wavelet spectra of PD waveforms by all of these methods with a reasonable degree of accuracy.

Published in:

Dielectrics and Electrical Insulation, IEEE Transactions on  (Volume:17 ,  Issue: 1 )

Date of Publication:

February 2010

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.