Cart (Loading....) | Create Account
Close category search window

Microstructural and mechanical characterisation of Al back contact layers and its application to thermomechanical mulitscale modeling of solar cells

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Popovich, V.A. ; Dept. of Mater. Sci. & Eng., Delft Univ. of Technol., Delft, Netherlands ; van Amstel, T. ; Bennett, I.J. ; Janssen, M.
more authors

The overall demand to reduce solar energy costs gives a continuous drive to reduce the thickness of silicon wafers. Handling and bowing problems associated with thinner wafers become more and more important, as these can lead to cells cracking and high yield losses. In this paper a discussion of the microstructure and mechanical properties of the aluminium on the rear side of a solar cell is presented. It will be shown that the aluminium back contact has a complex composite-like microstructure, consisting of five main components: 1) the back surface field layer 2) a eutectic layer 3) spherical (3 - 5 ¿m) hypereutectic Al-Si particles, surrounded by a thin aluminum oxide layer (200 nm); 4) a bismuth-silicate glass matrix; 5) pores (15 vol.%). The Young's modulus of the Al-Si particles is estimated by nanoindentation. These results are used as input parameters for an improved thermomechanical multiscale model of a silicon solar cell.

Published in:

Photovoltaic Specialists Conference (PVSC), 2009 34th IEEE

Date of Conference:

7-12 June 2009

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.