Cart (Loading....) | Create Account
Close category search window

Feasibility Study on an Ultra-High-Resolution SPECT With CdTe Detectors

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Ogawa, K. ; Fac. of Sci. & Eng., Hosei Univ., Koganei, Japan ; Muraishi, M.

The development of semiconductor detectors such as CdTe and CdZnTe, which work at room temperature, has led us to study the design of a new single photon emission computed tomography (SPECT) system. These semiconductor detectors have a high energy resolution. Moreover, they are used as pixellated detectors, and so the intrinsic resolution can be equal to the size of the pixel used for measurement. The detector pixel is as small as 0.5 mm, and so the spatial resolution of a reconstructed SPECT image can be less than 3 mm full-width at half-maximum. To clarify the feasibility of an ultra-high-resolution SPECT system, we conducted some simulations and evaluated the quality of images. In these simulations, we used a diverging collimator to enlarge the field of view of the detector and compared the quality of the reconstructed images of a pixellated SPECT system with a conventional SPECT system with a scintillation detector and parallel-hole collimator under the same sensitivity and reduced sensitivity. The results showed that the improvement of the spatial resolution in the pixellated semiconductor detector yielded high-quality images even under the low sensitivity condition due to the small size of the pixels.

Published in:

Nuclear Science, IEEE Transactions on  (Volume:57 ,  Issue: 1 )

Date of Publication:

Feb. 2010

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.