Cart (Loading....) | Create Account
Close category search window

Frequency Dependant Bit Appending: An Enhancement to Statistical Codes for Test Data Compression

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Mehta, U.S. ; Inst. of Technol., Nirma Univ., Ahmedabad, India ; Dasgupta, K.S. ; Devashrayee, N.M.

Test data compression is a basic necessity for today's test methodology with reference to test cost and test time. This paper presents a compression/decompression scheme based on frequency dependant bit appending of test vector used with statistical codes. In the proposed scheme, the emphasis is not only on data compression but it aims the data compression with a smaller amount of silicon area overhead for on chip decoder. We have observed that when the number of bits per test vector is prime number or multiplication of prime number (particularly multiplied by 2 or 3), statistical codes gives a large area overhead. The proposed scheme of frequency dependant bit appending (FDBA) shows that in such cases, if we append few bits at the end of test vector before compression, it improves % compression with very less area overhead. With ISCAS benchmark circuits, it has been shown that when the proposed scheme is applied with statistical coding method, it not only improves % compression, but the area overhead is reduced a lot compared to the base statistical method.

Published in:

India Conference (INDICON), 2009 Annual IEEE

Date of Conference:

18-20 Dec. 2009

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.