Cart (Loading....) | Create Account
Close category search window
 

Some Investigations in Function Minimization

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Birta, Louis G. ; Department of Computer Science, University of Ottawa, Ottawa, Ont., Canada.

Significant advances have been made over the past decade in the development of powerful function minimization methods. Although the essential structure of each of these methods is fixed, several auxiliary features invariably remain to be selected by the user in any actual implementation. The effectiveness of the methods can, furthermore, be greatly influenced by the choice made by the user in this regard. The sensitivity of a variety of different methods to three of these features is examined through a series of computational experiments. These features are 1) the type of gradient information used (exact or approximated), 2) the precision requested in the solution of the line search subproblem, and 3) the superposition, on the basic algorithm, of a policy of periodic reinitialization.

Published in:

Systems, Man and Cybernetics, IEEE Transactions on  (Volume:SMC-6 ,  Issue: 3 )

Date of Publication:

March 1976

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.