Cart (Loading....) | Create Account
Close category search window
 

Two Algorithms for Multiple-View Binary Pattern Reconstruction

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Chang, S. K. ; IBM Thomas J. Watson Res. Center, Yorktown Heights, N. Y. 10598 ; Shelton, G. L.

The problem of reconstructing binary patterns from their shadows or projections is treated. Two algorithms are formulated. For the two-view case, both algorithms give a perfect reconstruction if and only if the pattern is two-view unambiguous. It is also shown that n views are sufficient, but not necessary, to reconstruct any n × n binary pattern. Experimental results for the four-view reconstruction of 25 × 25 binary patterns indicate that one of the algorithms has good convergency behavior.

Published in:

Systems, Man and Cybernetics, IEEE Transactions on  (Volume:SMC-1 ,  Issue: 1 )

Date of Publication:

Jan. 1971

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.