By Topic

Background DAC Error Estimation Using a Pseudo Random Noise Based Correlation Technique for Sigma-Delta Analog-to-Digital Converters

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Witte, P. ; Inst. of Microelectron., Univ. of Ulm, Ulm, Germany ; Ortmanns, M.

This paper presents a new approach for estimating non-idealities in unit element feedback digital-to-analog converters of Sigma-Delta analog-to-digital converters. The presented method involves a background correlation technique to determine static and dynamic device mismatches causing linear time-invariant errors of the unit cells, as well as a way to digitally correct a modulator's output. Simulations show that the method can be used to precisely estimate imperfections and improve non-ideal modulators up to their ideal resolution, independent from the chosen oversampling ratio or architecture. The method is defined mathematically and verified by simulations. Comparisons with a common dynamic element matching technique show its superior behavior especially for low oversampling ratios.

Published in:

Circuits and Systems I: Regular Papers, IEEE Transactions on  (Volume:57 ,  Issue: 7 )