Close category search window
 

An access control model for grid computing based on security information evaluation

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Ping Xie ; Dept. of Comput. Sci., North China Electr. Power Univ., Beijing, China ; Jiang Zhou

There are multiple administrative domains in a grid environment where each domain has a policy space of their own. Generally, a mobile process usually travels from one policy space to another. However, current grid security infrastructure lacks in support of mobile processes in grid environment. This paper presents a credit quantitative criterion for a mobile process, and realizes security information evaluation according to these quantitative criteria. Relevant algorithms are designed to decide whether a mobile process is allowed to perform an operation. By using the dynamical access control mechanism based on security information evaluation, the flexibility of mobile processes and availability of network security facilities are enhanced.

Published in:
BioMedical Information Engineering, 2009. FBIE 2009. International Conference on Future

Date of Conference: 13-14 Dec. 2009

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.