By Topic

Investigation of Lu1.8Gd0.2SiO5:Ce (LGSO) scintillators with APD readout for medical imaging applications

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Shimizu, S. ; Hitachi Chem. Co., Ltd., Hitachinaka, Japan ; Pepin, C.M. ; Lecomte, R.

New high lutetium content Lu1.8Gd0.2SiO5:Ce (LGSO) scintillators with promising physical properties for PET, but also for SPECT and X-ray counting CT applications, have recently been developed. The new crystals have a high density (7.3 g/cc), high light output (>90% of NaI(Tl)), suitable emission wavelength for APD readout (420, 480 nm), and fast decay time that can be adjusted from 34 to 45 ns by varying Ce-doping concentration. Three different LGSO species with 0.025 mol% Ce (34.2 ± 0.3 ns), 0.15 mol% Ce (38.3 ± 0.3 ns) and 0.75 mol% Ce (44.8 ± 0.3 ns) were investigated. Photoelectron yields measured with a high performance UV-enhanced APD readout were respectively 12380 ± 570, 14250 ± 570 and 17690 ± 760 phe/MeV. Energy spectra of 68Ge (511 keV, PET), 99mTc (140 keV, SPECT) and 241Am (60 keV, CT) sources were obtained with the crystals coupled to the APD. FWHM energy resolutions at 511, 140 and 60 keV reached 10.5%, 17.6% and 32.2%, respectively. Timing resolution was measured in reference to a fast PMT-plastic detector and yielded 1.3-1.5 ns. It is concluded that APD-based detectors using these new high lutetium content LGSO scintillators are very promising candidates for multimodality medical imaging applications.

Published in:

Nuclear Science Symposium Conference Record (NSS/MIC), 2009 IEEE

Date of Conference:

Oct. 24 2009-Nov. 1 2009