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High-resolution alpha spectrometry with a thin-window silicon carbide semiconductor detector

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3 Author(s)
Ruddy, F.H. ; Ruddy Consulting, Mount Pleasant, SC, USA ; Seidel, J.G. ; Sellin, P.

The potential for high-resolution alpha-particle energy spectrometry in high-temperature, high-radiation environments using thin-window 4H-SiC radiation detectors has been demonstrated. 238Pu alpha-particle peaks separated by only 42.7 keV have been completely resolved using a SiC Schottky detector with a 400 A¿ titanium Schottky contact (entrance window). The observed FWHM for the 238Pu 5499.2-keV alpha particle peak is 20.6 keV or 0.37%. Factors affecting the observed alpha-particle energy resolution in SiC detectors will be discussed.

Published in:

Nuclear Science Symposium Conference Record (NSS/MIC), 2009 IEEE

Date of Conference:

Oct. 24 2009-Nov. 1 2009

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