By Topic

Output-Dependent Diagnostic Test Generation

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Pomeranz, I. ; Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA ; Reddy, S.M.

Existing diagnostic test generation procedures are output-independent, i.e., they attempt to distinguish faults on any output. We show that an output-dependent approach can facilitate diagnostic test generation and produce smaller diagnostic test sets for stuck-at faults in full-scan circuits. In the proposed output-dependent approach, the outputs of the circuit are considered one at a time. Faults in the logic cone of an output z under consideration are distinguished from other faults by detecting some faults but not others on z. Diagnostic test generation is facilitated by the need to consider only the inputs driving the output under consideration. Furthermore, we demonstrate that an output typically has a small number of input vectors that differ in their subsets of detected faults and are thus effective for diagnosis.

Published in:

VLSI Design, 2010. VLSID '10. 23rd International Conference on

Date of Conference:

3-7 Jan. 2010