Close category search window
 

Mobile robot based odor source localization via particle filter

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Ji-Gong Li ; Sch. of Electr. Eng. & Autom., Tianjin Univ., Tianjin, China ; Qing-Hao Meng ; Fei Li ; Ming Zeng
more authors

We consider odor-source localization using a mobile robot in a time-variant airflow-field environment. Novel plume tracing and odor-source declaration methods are presented. When odor plume clue is found, an odor-patch path is estimated by a dynamic-window approach, and the robot traces the plume along a route planned from the odor-patch path. In parallel, a particle filter is used to localize an odor source. The source is declared if the estimated locations converge in a relatively small area for a given period. In view of the common foundational odor concentration that already exists in the local or even whole searched area before the robot searches, differential concentration based on moving-average value is used to obtain an adaptively variable concentration threshold. Experiment results in an indoor time-variant airflow experiment show that the robot can effectively approach and declare the odor source.

Published in:
Decision and Control, 2009 held jointly with the 2009 28th Chinese Control Conference. CDC/CCC 2009. Proceedings of the 48th IEEE Conference on

Date of Conference: 15-18 Dec. 2009

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.