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Accurate diode forward and reverse recovery model using asymptotic waveform evaluation techniques

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2 Author(s)
Beyene, W.T. ; Illinois Univ., Urbana, IL, USA ; Schutt-Aine, J.E.

An accurate simulation of diode forward and reverse recovery phenomena using AWE is presented. Moment-matching technique is applied directly to the drift-diffusion equation to construct a reduced-order model that describes the dynamic process occurring in a p-n junction. The model provides an increasingly accurate approximation to the characteristics of the device under all operating conditions. It simulates accurately the diode transient behavior and high frequency characteristics in power electronic simulation. The p-n diode recovery phenomenon is simulated, and the improved accuracy is verified by comparisons with SPICE simulations

Published in:

Circuits and Systems, 1996. ISCAS '96., Connecting the World., 1996 IEEE International Symposium on  (Volume:1 )

Date of Conference:

12-15 May 1996