By Topic

Induced EM field in a layered eccentric spheres model of the head: plane-wave and localized source exposure

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Skaropoulos, N.C. ; Dept. of Electr. & Comput. Eng., Aristotelian Univ. of Thessaloniki, Greece ; Ioannidou, M.P. ; Chrissoulidis, D.P.

The induced electromagnetic (EM) field in a layered eccentric spheres structure is determined through a concise analytical formulation based on indirect mode-matching (IMM). The exact analytical solution is applied to a six-layer model of the head. This model allows for eccentricity between the inner and outer sets of concentric spherical layers which simulate brain and skull, respectively. Excitation is provided by a nearby localized source or by an incident plane wave. The numerical application provides information about the total absorbed power, the absorption in each layer, and the spatial distribution of the specific absorption rate (SAR) at frequencies used by cellular phones. The effects of excitation frequency, eccentricity, exposure configuration, and antenna-head separation are investigated

Published in:

Microwave Theory and Techniques, IEEE Transactions on  (Volume:44 ,  Issue: 10 )