By Topic

An investigation of strategies for finding test order during Integration testing of object Oriented applications

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Priti Bansal ; Department of Computer Science, NSIT, Delhi, India ; Sangeeta Sabharwal ; Parneeta Sidhu

In recent past a number of researchers have proposed strategies for finding test order during Integration testing of object oriented applications while minimizing the cost of stub creation. Some researchers have used graph-based approach while others have suggested solutions using genetic algorithms. This paper presents a survey of various graph-based strategies and genetic algorithm based strategies proposed in literature so far. The aim of this paper is to provide a comprehensive review of various strategies for finding test order for object-oriented applications with their advantages and weaknesses. This paper also proposes a strategy that integrates two existing methods aimed at finding test order of object-oriented applications. Our goal is to propose an improvement to the existing strategy for finding test order of C++ application by combining some principles of both the approaches and addresses some of their shortcomings by including new dependencies between classes. The approach is implemented using a tool Class Test Ordering System (CTOS).

Published in:

Methods and Models in Computer Science, 2009. ICM2CS 2009. Proceeding of International Conference on

Date of Conference:

14-15 Dec. 2009