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Using Launch-on-Capture for Testing BIST Designs Containing Synchronous and Asynchronous Clock Domains

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8 Author(s)
Laung-Terng Wang ; Department of Electrical Engineering and the Graduate Institute of Electronics Engineering, Department of Creative Informatics, School of Software, SynTest Technologies, Inc., National Taiwan University, Kyushu Institute of Technology, Tsinghua University, Sunnyvale, Taipei, Iizuka, CA, USAJapanChina ; Xiaoqing Wen ; Shianling Wu ; Hiroshi Furukawa
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This paper presents a new at-speed logic built-in self-test (BIST) architecture supporting two launch-on-capture schemes, namely aligned double-capture and staggered double-capture, for testing multi-frequency synchronous and asynchronous clock domains in a scan-based BIST design. The proposed architecture also includes BIST debug and diagnosis circuitry to help locate BIST failures. The aligned scheme detects and allows diagnosis of structural and delay faults among all synchronous clock domains, whereas the staggered scheme detects and allows diagnosis of structural and delay faults among all asynchronous clock domains. Both schemes solve the long-standing problem of using the conventional one-hot scheme, which requires testing each clock domain one at a time, or the simultaneous scheme, which requires adding isolation logic to normal functional paths across interacting clock domains. Physical implementation is easily achieved by the proposed solution due to the use of a slow-speed, global scan enable signal and reduced timing-critical design requirements. Application results for industrial designs demonstrate the effectiveness of the proposed architecture.

Published in:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems  (Volume:29 ,  Issue: 2 )